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Proceedings of 7th International Conference on VLSI Design

Jan. 5 1994 to Jan. 8 1994

Calcutta, India

Table of Contents

SEMU: a parallel processing system for timing simulation of digital CMOS VLSI circuitsFull-text access may be available. Sign in or learn about subscription options.pp. 33,34,35,36,37,38
Logic simulation using an asynchronous parallel discrete-event simulation model on a SIMD machineFull-text access may be available. Sign in or learn about subscription options.pp. 29,30,31,32
FAST: FPGA targeted RTL structure synthesis techniqueFull-text access may be available. Sign in or learn about subscription options.pp. 21,22,23,24
ILP-based scheduling with time and resource constraints in high level synthesisFull-text access may be available. Sign in or learn about subscription options.pp. 17,18,19,20
An empirical study on the effects of physical design in high-level synthesisFull-text access may be available. Sign in or learn about subscription options.pp. 11,12,13,14,15,16
Application of high-level synthesis in an industrial projectFull-text access may be available. Sign in or learn about subscription options.pp. 5,6,7,8,9,10
Ultra fine-grain template-driven synthesisFull-text access may be available. Sign in or learn about subscription options.pp. 25,26,27,28
CM-SIM: a parallel circuit simulator on a distributed memory multiprocessorFull-text access may be available. Sign in or learn about subscription options.pp. 39,40,41,42,43,44
Parallel model evaluation for circuit simulation on the PACE multiprocessorFull-text access may be available. Sign in or learn about subscription options.pp. 45,46,47,48
Time- and cost-optimal parallel algorithms for the dominance and visibility graphs /spl lsqb/IC design/spl rsqb/Full-text access may be available. Sign in or learn about subscription options.pp. 49,50,51,52
Analog modeling using event-driven HDL'sFull-text access may be available. Sign in or learn about subscription options.pp. 53,54,55,56
A SPICE model of RLGC transmission line with error controlFull-text access may be available. Sign in or learn about subscription options.pp. 57,58,59,60
Multiple fault testing in analog circuitsFull-text access may be available. Sign in or learn about subscription options.pp. 61,62,63,64,65,66
The design of analog self-checking circuitsFull-text access may be available. Sign in or learn about subscription options.pp. 67,68,69,70
OTA based neural network architectures with on-chip tuning of synapsesFull-text access may be available. Sign in or learn about subscription options.pp. 71,72,73,74,75,76
TWTXBB: a low latency, high throughput multiplier architecture using a new 4/spl rarr/2 compressorFull-text access may be available. Sign in or learn about subscription options.pp. 77,78,79,80,81,82
Calculation of minimum number of registers in arbitrary life time chartFull-text access may be available. Sign in or learn about subscription options.pp. 83,84,85,86
A VLSI architecture of an inverse discrete cosine transformFull-text access may be available. Sign in or learn about subscription options.pp. 87,88,89,90
A fast algorithm for performing vector quantization and its VLSI implementationFull-text access may be available. Sign in or learn about subscription options.pp. 91,92,93,94
A 600 MHz half-bit level pipelined multiplier macrocellFull-text access may be available. Sign in or learn about subscription options.pp. 95,96,97,98,99,100
A three-stage partial scan design method using the sequential circuit flow graphFull-text access may be available. Sign in or learn about subscription options.pp. 101,102,103,104,105,106
Simulated annealing for target-oriented partial scanFull-text access may be available. Sign in or learn about subscription options.pp. 107,108,109,110,111,112
A test function architecture for interconnected finite state machinesFull-text access may be available. Sign in or learn about subscription options.pp. 113,114,115,116
A BIST PLA design for high fault coverage and testing by an interleavingly crosspoint countingFull-text access may be available. Sign in or learn about subscription options.pp. 117,118,119,120,121,122
Testability properties of local circuit transformations with respect to the robust path-delay-fault modelFull-text access may be available. Sign in or learn about subscription options.pp. 123,124,125,126
Flipping modules to improve circuit performance and routabilityFull-text access may be available. Sign in or learn about subscription options.pp. 127,128,129,130,131,132
A new genetic algorithm for the channel routing problemFull-text access may be available. Sign in or learn about subscription options.pp. 133,134,135,136
High performance over-the-cell routingFull-text access may be available. Sign in or learn about subscription options.pp. 137,138,139,140,141,142
Over-the-cell routing algorithms for industrial cell modelsFull-text access may be available. Sign in or learn about subscription options.pp. 143,144,145,146,147,148
Two-layer wiring with pin preassignments is easier if the power supply nets are already generatedFull-text access may be available. Sign in or learn about subscription options.pp. 149,150,151,152,153,154
Rapid technology projection for high-level synthesisFull-text access may be available. Sign in or learn about subscription options.pp. 155,156,157,158
Behavioral design and prototyping of a fail-safe systemFull-text access may be available. Sign in or learn about subscription options.pp. 159,160,161,162
BINET: an algorithm for solving the binding problemFull-text access may be available. Sign in or learn about subscription options.pp. 163,164,165,166,167,168
A CAD tool for design of on-chip store and generate schemeFull-text access may be available. Sign in or learn about subscription options.pp. 169,170,171,172,173,174
HSIM1 and HSIM2: object oriented algorithms for VHDL simulationFull-text access may be available. Sign in or learn about subscription options.pp. 175,176,177,178
I/sub DDQ/ measurement based diagnosis of bridging faults in full scan circuitsFull-text access may be available. Sign in or learn about subscription options.pp. 179,180,181,182
I/sub DDQ/ detection of CMOS bridging faults by stuck-at fault testsFull-text access may be available. Sign in or learn about subscription options.pp. 183,184,185,186
The effect of built-in current sensors (BICS) on operational and test performance /spl lsqb/CMOS ICs/spl rsqb/Full-text access may be available. Sign in or learn about subscription options.pp. 187,188,189,190
On testability of differential split-level CMOS circuitsFull-text access may be available. Sign in or learn about subscription options.pp. 191,192,193,194,195,196
Testable realizations of CMOS combinational circuits for voltage and current testingFull-text access may be available. Sign in or learn about subscription options.pp. 197,198,199,200,201,202
On the synthesis of gate matrix layoutFull-text access may be available. Sign in or learn about subscription options.pp. 203,204,205,206
An efficient hybrid heuristic for the gate matrix layout problem in VLSI designFull-text access may be available. Sign in or learn about subscription options.pp. 207,208,209,210
SAGA : a unification of the genetic algorithm with simulated annealing and its application to macro-cell placementFull-text access may be available. Sign in or learn about subscription options.pp. 211,212,213,214
GLOVE: a graph-based layout verifierFull-text access may be available. Sign in or learn about subscription options.pp. 215,216,217,218,219,220
A sea-of-gates style FPGA placement algorithmFull-text access may be available. Sign in or learn about subscription options.pp. 221,222,223,224
A methodology for architecture synthesis of cascaded IIR filters on TLU FPGAsFull-text access may be available. Sign in or learn about subscription options.pp. 225,226,227,228
High speed digital filtering on SRAM-based FPGAsFull-text access may be available. Sign in or learn about subscription options.pp. 229,230,231,232
Impact of logic module routing flexibility on the routability of antifuse-based channelled FPGA architecturesFull-text access may be available. Sign in or learn about subscription options.pp. 233,234,235,236
Detailed routing of multi-terminal nets in FPGAsFull-text access may be available. Sign in or learn about subscription options.pp. 237,238,239,240,241,242
A switch-memory chip for packet switching at gigabits per secondFull-text access may be available. Sign in or learn about subscription options.pp. 243,244,245,246
A 2K/spl times/1K space switch ASIC for use in digital exchangesFull-text access may be available. Sign in or learn about subscription options.pp. 247,248,249,250
Layout influenced factorization of Boolean functionsFull-text access may be available. Sign in or learn about subscription options.pp. 251,252,253,254
On determining symmetries in inputs of logic circuitsFull-text access may be available. Sign in or learn about subscription options.pp. 255,256,257,258,259,260
Energy efficient programmable computationFull-text access may be available. Sign in or learn about subscription options.pp. 261,262,263,264
Synthesis of low power linear DSP circuits using activity metricsFull-text access may be available. Sign in or learn about subscription options.pp. 265,266,267,268,269,270
Power constraint scheduling of testsFull-text access may be available. Sign in or learn about subscription options.pp. 271,272,273,274
Design of an application specific VLSI chip for image rotationFull-text access may be available. Sign in or learn about subscription options.pp. 275,276,277,278
Cellular automata based VLSI architecture for computing multiplication and inverses in GF(2/sup m/)Full-text access may be available. Sign in or learn about subscription options.pp. 279,280,281,282
Architecture for VLSI design of CA based byte error correcting code decodersFull-text access may be available. Sign in or learn about subscription options.pp. 283,284,285,286
VLSI architecture for HDTV motion estimation based on block-matching algorithmFull-text access may be available. Sign in or learn about subscription options.pp. 287,288,289,290
ACE: a VLSI chip for Galois field GF(2/sup m/) based exponentiationFull-text access may be available. Sign in or learn about subscription options.pp. 291,292,293,294,295,296
An optimal design for parallel test generation based on circuit partitioningFull-text access may be available. Sign in or learn about subscription options.pp. 297,298,299,300
Data path testability evaluation via functional testability measuresFull-text access may be available. Sign in or learn about subscription options.pp. 301,302,303,304,305,306
An improved deductive fault simulatorFull-text access may be available. Sign in or learn about subscription options.pp. 307,308,309,310
On probabilistic testing of large-scale sequential circuits using circuit decompositionFull-text access may be available. Sign in or learn about subscription options.pp. 311,312,313,314
Low-cost redundancy identification for combinational circuitsFull-text access may be available. Sign in or learn about subscription options.pp. 315,316,317,318
Finite element analysis of SiGe npn HBTFull-text access may be available. Sign in or learn about subscription options.pp. 319,320,321,322
nOHM/spl minus/a multi-process device synthesis tool for lateral DMOS structuresFull-text access may be available. Sign in or learn about subscription options.pp. 323,324,325,326,327
3D effects in VLSI/ULSI MOSFETs: a novel analytical approach to model threshold voltageFull-text access may be available. Sign in or learn about subscription options.pp. 328,329,330,331,332
Parameterized modeling of open-circuit critical volume for three-dimensional defects in VLSI processingFull-text access may be available. Sign in or learn about subscription options.pp. 333,334,335,336,337,338
LATCHSIM/spl minus/a latch-up simulator in VLSI CAD environment for CMOS and BiCMOS circuitsFull-text access may be available. Sign in or learn about subscription options.pp. 339,340,341,342
A CORDIC based programmable DXT processor arrayFull-text access may be available. Sign in or learn about subscription options.pp. 343,344,345,346,347,348
Hierarchical reconfiguration of VLSI/WSI arraysFull-text access may be available. Sign in or learn about subscription options.pp. 349,350,351,352
A linear systolic array for LU decompositionFull-text access may be available. Sign in or learn about subscription options.pp. 353,354,355,356,357,358
An algorithm to test reconfigured RAMsFull-text access may be available. Sign in or learn about subscription options.pp. 359,360,361,362,363,364
Response pipelined CAM chips: the first generation and beyondFull-text access may be available. Sign in or learn about subscription options.pp. 365,366,367,368
An integrated approach to state assignment and sequential element selection for FSM synthesisFull-text access may be available. Sign in or learn about subscription options.pp. 369,370,371,372
A new approach to synthesis of PLA-based FSM'sFull-text access may be available. Sign in or learn about subscription options.pp. 373,374,375,376,377,378
Bitwise encoding of finite state machinesFull-text access may be available. Sign in or learn about subscription options.pp. 379,380,381,382
Synthesis of initializable asynchronous circuitsFull-text access may be available. Sign in or learn about subscription options.pp. 383,384,385,386,387,388
Mechanical identification of inductive properties during verification of finite state machinesFull-text access may be available. Sign in or learn about subscription options.pp. 389,390,391,392,393,394
Multiobjective search in VLSI designFull-text access may be available. Sign in or learn about subscription options.pp. 395,396,397,398,399,400
Graphical methodology language for CAD frameworksFull-text access may be available. Sign in or learn about subscription options.pp. 401,402,403,404,405,406
An object oriented environment for modeling and synthesis of hardware circuitsFull-text access may be available. Sign in or learn about subscription options.pp. 407,408,409,410,411,412
Early exploration of the multi-dimensional VLSI design spaceFull-text access may be available. Sign in or learn about subscription options.pp. 413,414,415,416
Verification of circuits described in VHDL through extraction of design intentFull-text access may be available. Sign in or learn about subscription options.pp. 417,418,419,420
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