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Mixed-Signals, Sensors, and Systems Test Workshop, IEEE 14th International

May 16 2011 to May 18 2011

Santa Barbara, California USA

ISBN: 978-0-7695-4479-3

Table of Contents

Papers
Title Page iFreely available from IEEE.pp. i
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Title Page iiiFreely available from IEEE.pp. iii
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Copyright PageFreely available from IEEE.pp. iv
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Table of ContentsFreely available from IEEE.pp. v-viii
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Chairs' WelcomeFreely available from IEEE.pp. ix
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Organizing CommitteeFreely available from IEEE.pp. x
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Program CommitteeFreely available from IEEE.pp. xi
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Steering CommitteeFreely available from IEEE.pp. xii
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ReviewersFreely available from IEEE.pp. xiii
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New View Requirements for Analogue/MS IPs for Dependability Optimization in Heterogeneous SoC DesignFull-text access may be available. Sign in or learn about subscription options.pp. 1-6
by Hans G. Kerkhoff
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Context-Based Collaborative Self-Test for Autonomous Wireless Sensor NetworksFull-text access may be available. Sign in or learn about subscription options.pp. 7-12
by Marcin Marzencki, Yifeng Huang, Bozena Kaminska
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Mixed Signal System Level Cross Layer Adaptation for Variability and Workload: A Pilot StudyFull-text access may be available. Sign in or learn about subscription options.pp. 13-18
by Shreyas Sen, Jayaram Natarajan, Joshua W. Wells, Abhijit Chatterjee
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Trim DAC Design with Minimum DNL for Self-Trim with Self-Test SchemesFull-text access may be available. Sign in or learn about subscription options.pp. 19-24
by Hans Martin von Staudt
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On Pre/Post-Bond Testing and Calibrating SAR ADC Array in 3-D CMOS ImagerFull-text access may be available. Sign in or learn about subscription options.pp. 25-28
by Xuan-Lun Huang, Ping-Ying Kang, Jiun-Lang Huang, Yung-Fa Chou, Yung-Pin Lee, Ding-Ming Kwai
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Image-Quality-Driven Metrics for Testing and Calibrating ADC Array in CMOS Imagers: A First StepFull-text access may be available. Sign in or learn about subscription options.pp. 29-32
by Hsiu-Ming Sherman Chang, Kwang-Ting Tim Cheng, Jiun-Lang Huang
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Low-Distortion Single-Tone and Two-Tone Sinewave Generation Algorithms Using an Arbitrary Waveform GeneratorFull-text access may be available. Sign in or learn about subscription options.pp. 33-38
by Kazuyuki Wakabayashi, Takafumi Yamada, Satoshi Uemori, Osamu Kobayashi, Keisuke Kato, Haruo Kobayashi, Kiichi Niitsu, Hiroyuki Miyashita, Shinya Kishigami, Kunihito Rikino, Yuji Yano, Tatsuhiro Gake
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Electrodes Architectures for Dielectrophoretic-Based Cells Manipulation in LoCs: Modeling, Simulation and Experimental ResultsFull-text access may be available. Sign in or learn about subscription options.pp. 39-42
by Mohamed Amine Miled, Antoine Gagné, Mohamad Sawan
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PPM-accuracy Error Estimates for Low-Cost Analog Test: A Case StudyFull-text access may be available. Sign in or learn about subscription options.pp. 43-47
by Nathan Kupp, Haralampos Stratigopoulos, Petros Drineas, Yiorgos Makris
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Parametric Test Metrics Estimation Using Non-gaussian CopulasFull-text access may be available. Sign in or learn about subscription options.pp. 48-52
by Kamel Beznia, Ahcène Bounceur, Salvador Mir, Reinhardt Euler
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Low-Noise Power Delivery Network Design Using Power Transmission Line for Mixed-Signal TestingFull-text access may be available. Sign in or learn about subscription options.pp. 53-57
by Suzanne Huh, Madhavan Swaminathan, David Keezer
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Digitally-Assisted Compensation Technique for Timing Skew in ATE SystemsFull-text access may be available. Sign in or learn about subscription options.pp. 58-63
by Koji Asami, Takenori Tateiwa, Tsuyoshi Kurosawa, Hiroyuki Miyajima, Haruo Kobayashi
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Extending Low-Cost Test Signal Synthesis to 40 GbpsFull-text access may be available. Sign in or learn about subscription options.pp. 64-66
by David Keezer, Carl Gray
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Arbitrary Waveform Generator Response Shaping Method to Enable ADC Linearity Testing on Very Low Cost Automatic Test EquipmentFull-text access may be available. Sign in or learn about subscription options.pp. 67-71
by Sachin Dileep Dasnurkar, Jacob A. Abraham
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Optimal Linearity Testing of Sigma-Delta Based Incremental ADCs Using Restricted Code MeasurementsFull-text access may be available. Sign in or learn about subscription options.pp. 72-77
by Sehun Kook, Alfred Gomes, Le Jin, David Wheelright, Abhijit Chatterjee
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A Fully Integrated Built-In Self-Test S-? ADC on a Wireless Test PlatformFull-text access may be available. Sign in or learn about subscription options.pp. 78-81
by Shao-Feng Hung, Hao-Chiao Hong
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A MEMS Convective Accelerometer Equipped with On-Chip Facilities for Sensitivity Electrical CalibrationFull-text access may be available. Sign in or learn about subscription options.pp. 82-87
by Ahmed Amine Rekik, Florence Azaïs, Norbert Dumas, Frédérick Mailly, Pascal Nouet
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Move from Online Test to Fault-Tolerant: Design and Simulation of a Multi-functional MEMS SensorFull-text access may be available. Sign in or learn about subscription options.pp. 88-95
by Zhou Xu, Andrew Richardson, Mark Begbie, ChangHai Wang
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ADC and DAC Testing Using Impulse SignalsFull-text access may be available. Sign in or learn about subscription options.pp. 96-99
by Josef Vedral, Pavel Fexa
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A System-Level Model for an Analog-to-Digital ConverterFull-text access may be available. Sign in or learn about subscription options.pp. 100-105
by Jidan Al-Eryani, Dietmar Nitzsche, Sebastian Sattler
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FPAA Implementation and Validation of an SC Integrator Leakage Measurement TechniqueFull-text access may be available. Sign in or learn about subscription options.pp. 106-109
by Nian-Tze Du, Jiun-Lang Huang
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Design of a Design-for-Digital-Testability Third-Order S-? ModulatorFull-text access may be available. Sign in or learn about subscription options.pp. 110-113
by Shao-Feng Hung, Hao-Chiao Hong
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Inertial MEMS Test ChallengesFull-text access may be available. Sign in or learn about subscription options.pp. 114-119
by Ashok Solanki, Kanti Prasad, Rob Oreilly, Yatin Singhal
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Novel Adaptive FPGA-based Self-Calibration and Self-Testing Scheme with PN Sequences for MEMS-based Inertial SensorsFull-text access may be available. Sign in or learn about subscription options.pp. 120-126
by Ankit Kansal, Elie H. Sarraf, Mrigank Sharma, Edmond Cretu
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Functional Framework and Hardware Platform for Dependability Study in Short Range Wireless Embedded SystemsFull-text access may be available. Sign in or learn about subscription options.pp. 127-132
by Benaouneur Senouci, Anne-Johan Annema, Mark Bentum, Hans G. Kerkhoff
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A Concurrent Testing Technique for Analog-to-Digital ConvertersFull-text access may be available. Sign in or learn about subscription options.pp. 133-136
by Vadim Geurkov, Lev Kirischian
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The Search for Resilience Weak Spots in Automotive Mixed-Signal CircuitsFull-text access may be available. Sign in or learn about subscription options.pp. 137-142
by Vincent Kerzérho, Hans G. Kerkhoff, Gert-Jan Bollen, Yizi Xing
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Neural-Network Fault Diagnosis for Electrode Structures in Bio-fluidic MicrosystemsFull-text access may be available. Sign in or learn about subscription options.pp. 143-148
by Qais Al-Gayem, Andrew Richardson, Hong Liu
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Placement Optimization of Flexible TFT Digital CircuitsFull-text access may be available. Sign in or learn about subscription options.pp. 149-152
by Wei-Hsiao Liu, En-Hua Ma, Wen-En Wei, James Chien-Mo Li
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An Improved Light Source Using Filtered Tungsten Lamps as an Affordable Solar Simulator for Testing of Photovoltaic CellsFull-text access may be available. Sign in or learn about subscription options.pp. 153-158
by Clint Landrock, Badr Omrane, Jeydmer Aristizabal, Bozena Kaminska, Carlo Menon
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Author IndexFreely available from IEEE.pp. 159-160
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Publisher's InformationFreely available from IEEE.pp. 162
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