
Proceedings First IEEE International Workshop on Electronic Design, Test and Applications '2002
Jan. 29 2002 to Jan. 31 2002
Christchurch, New Zealand
Table of Contents
Digital Signal Processing and Architectures
Digital Signal Processing and Architectures
Digital Signal Processing and Architectures
From Low to High Level Fault Simulation and Diagnosis
From Low to High Level Fault Simulation and Diagnosis
From Low to High Level Fault Simulation and Diagnosis
Power Issues in Design and Test
Power Issues in Design and Test
Sensor and Analog Design
Sensor and Analog Design
Special Session on Education
Special Session on Education
Special Session on Education
Special Session on Education
Special Session on Education
Special Session on Education
Special Session on Electromagnetics and Control
Special Session on Electromagnetics and Control
Special Session on Electromagnetics and Control
Special Session on Electromagnetics and Control
Special Session on Electromagnetics and Control
Special Session on FPGA
Special Session on FPGA
Special Session on Image Processing
Special Session on Image Processing
Special Session on Image Processing
Special Session on Image Processing
Special Session on Image Processing
Special Session on Robotics
Special Session on Robotics
Special Session on Robotics
Special Session on Submicron Technology
Special Session on Submicron Technology
Special Session on Submicron Technology
Special Session on Submicron Technology
Test Generation and Compaction
Test Generation and Compaction
Test Generation and Compaction
Test Generation and Compaction
Test Generation and Compaction
Test Techniques and Methodologies
Test Techniques and Methodologies
Poster Papers