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2022 Third International Conference on Information Systems and Software Technologies (ICI2ST)

Nov. 8 2022 to Nov. 10 2022

Quito, Ecuador

ISBN: 978-1-6654-5517-6

Table of Contents

Half Title PageFreely available from IEEE.pp. i-i
Title PageFreely available from IEEE.pp. iii-iii
Copyright PageFreely available from IEEE.pp. 1-1
Table of ContentsFreely available from IEEE.pp. v-viii
Message from the General ChairFreely available from IEEE.pp. ix-ix
Organizing CommitteeFreely available from IEEE.pp. x-xi
ReviewersFreely available from IEEE.pp. xii-xiii
A Prototype for Interpretation of Sars-Cov-2 Tests Using Artificial VisionFull-text access may be available. Sign in or learn about subscription options.pp. 8-13
Systematic Mapping: Translator Language from Sign Language to Colombian Formal LanguageFull-text access may be available. Sign in or learn about subscription options.pp. 44-48
Automated Web Annotator of Biomedical Entities in Spanish LanguageFull-text access may be available. Sign in or learn about subscription options.pp. 72-78
Neural Machine Translation tool from Spanish to English in the Medical DomainFull-text access may be available. Sign in or learn about subscription options.pp. 79-84
Functional ANOVA for Modelling Temperature Profiles in EcuadorFull-text access may be available. Sign in or learn about subscription options.pp. 99-106
Functional Data Analysis: A Meteorological Study Case in North of EcuadorFull-text access may be available. Sign in or learn about subscription options.pp. 107-113
Data Analytics Methodology Application in MarketingFull-text access may be available. Sign in or learn about subscription options.pp. 114-121
Educational Robotics as a Strategy to Develop Computational Thinking in Basic General EducationFull-text access may be available. Sign in or learn about subscription options.pp. 158-163
New Transformation Rules for the EduBPMN Method to Generate Graphical User Interfaces from BPMNFull-text access may be available. Sign in or learn about subscription options.pp. 164-171
Author IndexFreely available from IEEE.pp. 185-186
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