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First IEEE International Workshop on Information Assurance (IWIA'03)

Mar. 24 2003 to Mar. 24 2003

Darmstadt, Germany

ISBN: 0-7695-1886-9

Table of Contents

Introduction
Message from the Workshop ChairsFreely available from IEEE.pp. vi
Session I: Intrusion Detection I
Stochastic Protocol Modeling for Anomaly Based Network Intrusion DetectionFull-text access may be available. Sign in or learn about subscription options.pp. 3
Session I: Intrusion Detection I
Designing a Framework for Active Worm Detection on Global NetworksFull-text access may be available. Sign in or learn about subscription options.pp. 13
Session I: Intrusion Detection I
A Tamper-Resistant Framework for Unambiguous Detection of Attacks in User Space Using Process MonitorsFull-text access may be available. Sign in or learn about subscription options.pp. 25
Session II: Requirements and Metrics
Computational Complexity of the Network Routing Logical Security Assessment ProcessFull-text access may be available. Sign in or learn about subscription options.pp. 37
Session II: Requirements and Metrics
IT Design Critieria for Damage ReductionFull-text access may be available. Sign in or learn about subscription options.pp. 49
Session III: Intrusion Detection II
Intrusion Detection Testing and Benchmarking MethodologiesFull-text access may be available. Sign in or learn about subscription options.pp. 63
Session III: Intrusion Detection II
Intrusion Detection Force: An Infrastructure for Internet-Scale Intrusion DetectionFull-text access may be available. Sign in or learn about subscription options.pp. 73
Session IV: Systems and Applications
A Guard Architecture for Improved Coalition OperationsFull-text access may be available. Sign in or learn about subscription options.pp. 89
Session IV: Systems and Applications
Protecting the Integrity of an Entire File SystemFull-text access may be available. Sign in or learn about subscription options.pp. 95
Panel
Using the Trees to Find the Forest: Trustworthy Computing as a Systems-Level IssueFull-text access may be available. Sign in or learn about subscription options.pp. 109
Author Index
Author IndexFreely available from IEEE.pp. 113
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