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2010 11th Latin American Test Workshop

March 28 2010 to March 31 2010

Pule del Este

Table of Contents

Embedded test and control of analogue/RF circuits using intelligent resourcesFull-text access may be available. Sign in or learn about subscription options.pp. 1-2
by Emmanuel Simeu
Manufacturers to end-users tools for radiations induced reliability issues in electronic devicesFull-text access may be available. Sign in or learn about subscription options.pp. 1-1
by Frédéric Wrobel
Heterogeneous integration: Beyond CMOS – coping with variability at the end of the CMOS roadmapFull-text access may be available. Sign in or learn about subscription options.pp. 1-1
by Sergio Bampi
Reliability and safety of medical equipment by use of calibration and certification instrumentsFull-text access may be available. Sign in or learn about subscription options.pp. 1-4
by Guillermo Avendaño, Pablo Fuentes, Víctor Castillo, Constanza Garcia, Natalie Dominguez
On improving real-time observability for in-system post-silicon debugFull-text access may be available. Sign in or learn about subscription options.pp. 1-1
by Nicola Nicolici
Variability-aware physical design techniquesFull-text access may be available. Sign in or learn about subscription options.pp. 1-1
by Gustavo Wilke, Ricardo Reis
ICs and MEMS for energy managementFull-text access may be available. Sign in or learn about subscription options.pp. 1-1
by B. Courtois
An algorithm for diagnostic fault simulationFull-text access may be available. Sign in or learn about subscription options.pp. 1-5
by Yu Zhang, Vishwani D. Agrawal
The limitations of software signature and basic block sizing in soft error fault coverageFull-text access may be available. Sign in or learn about subscription options.pp. 1-8
by José Rodrigo Azambuja, Fernando Sousa, Lucas Rosa, Fernanda Lima Kastensmidt
Diversity TMR: Proof of concept in a mixed-signal caseFull-text access may be available. Sign in or learn about subscription options.pp. 1-6
by Gabriel de M. Borges, Luiz F. Gonçalves, Tiago R. Balen, Marcelo Lubaszewski
Automatic generation of a parameter-domain-based functional input coverage modelFull-text access may be available. Sign in or learn about subscription options.pp. 1-6
by Carlos Ivan Castro, Marius Strum, Wang Jiang Chau
A method for improving the radiation tolerance of PIN photodiodes by optimization of n− layer thickness and light wavelengthFull-text access may be available. Sign in or learn about subscription options.pp. 1-4
by A. P. Cédola, M. A. Cappelletti, E. L. Peltzer y Blancá
BICS-based March test for resistive-open defect detection in SRAMsFull-text access may be available. Sign in or learn about subscription options.pp. 1-6
by R. Chipana, L. Bolzani, F. Vargas
On Comparing and Complementing two MBT approachesFull-text access may be available. Sign in or learn about subscription options.pp. 1-6
by Maximiliano Cristiá, Valdivino Santiago, N. L. Vijaykumar
Bit-flip injection strategies for FSMs modeled in VHDL behavioral levelFull-text access may be available. Sign in or learn about subscription options.pp. 1-5
by John M. Espinosa-Duran, Vladimir Trujillo-Olaya, Jaime Velasco-Medina, Raoul Velazco
Reliability limits of TMR implemented in a SRAM-based FPGA: Heavy ion measures vs. fault injection predictionsFull-text access may be available. Sign in or learn about subscription options.pp. 1-5
by G. Foucard, P. Peronnard, R. Velazco
Fault prediction in electrical valves using temporal Kohonen mapsFull-text access may be available. Sign in or learn about subscription options.pp. 1-6
by Luiz F. Gonçalves, Eduardo L. Schneider, Renato Ventura B. Henriques, Marcelo Lubaszewski, Jefferson Luiz Bosa, Paulo Martins Engel
Functional test generation for DMA controllersFull-text access may be available. Sign in or learn about subscription options.pp. 1-6
by M. Grosso, W. J. Pérez H., D. Ravotto, E. Sanchez, M. Sonza Reorda, J. Velasco Medina
Procedures and lab setup developed to test MIFARE based transportation devices complianceFull-text access may be available. Sign in or learn about subscription options.pp. 1-5
by Fiorella Haim, Andrés Bergeret, Alejandra González, Ignacio Benavente
Mutation analysis with high-level decision diagramsFull-text access may be available. Sign in or learn about subscription options.pp. 1-6
by Hanno Hantson, Jaan Raik, Maksim Jenihhin, Anton Chepurov, Raimund Ubar, Giuseppe di Guglielmo, Franco Fummi
Concurrent test of Network-on-Chip interconnects and routersFull-text access may be available. Sign in or learn about subscription options.pp. 1-6
by Marcos Hervé, Pedro Almeida, Fernanda Lima Kastensmidt, Érika Cota, Marcelo Lubaszewski
Towards a transmission power self-optimization in reliable Wireless Sensor NetworksFull-text access may be available. Sign in or learn about subscription options.pp. 1-3
by F. Lavratti, A. R. Pinto, D. Prestes, L. Bolzani, F. Vargas, C. Montez
Automated test-bed for analog to digital convertersFull-text access may be available. Sign in or learn about subscription options.pp. 1-5
by José Erick de Souza Lima, Carlos A. dos Reis Filho
RF and Microwave production test requirements for advanced mixed-signal devicesFull-text access may be available. Sign in or learn about subscription options.pp. 1-4
by Mohamed Mabrouk
Test mode method and strategy for RF-based fault injection analysis for on-chip relaxation oscillators under EMC standard tests or RFI susceptibility characterizationFull-text access may be available. Sign in or learn about subscription options.pp. 1-3
by A. Olmos, A. Vilas Boas, E. R. da Silva, J. C. Silva, R. Maltione
Performance evaluation model for test processFull-text access may be available. Sign in or learn about subscription options.pp. 1-6
by Marcelo Marinho, Paulo Maciel, Erica Sousa, Teresa Maciel, Ermeson Andrade
Performance testing of distributed block-oriented storage over IP networksFull-text access may be available. Sign in or learn about subscription options.pp. 1-4
by Pedro Martinez-Julia, Antonio F. Gomez-Skarmeta
Emulating an Agilent™ 4142 on a Keithley™ 2600 series Source Measurement UnitFull-text access may be available. Sign in or learn about subscription options.pp. 1-3
by Jorge Moreno, Osvaldo Gonzalez, Rafael Vega, Rogelio Palomera, Manuel Jimenez
Experimental dependability assessment using a faultload specification toolFull-text access may be available. Sign in or learn about subscription options.pp. 1-6
by Ruthiano S. Munaretti, Bruno C. Fiss, Taisy S. Weber, Sérgio L. Cechin
Dynamic power modulation in baseband OFDM signal processor using application driven metrics: Image transmission and processingFull-text access may be available. Sign in or learn about subscription options.pp. 1-6
by Muhammad M. Nisar, Jayaram Natarajan, Abhijit Chatterjee
Dependability evaluation of distributed systems through partitioning fault injectionFull-text access may be available. Sign in or learn about subscription options.pp. 1-6
by Gustavo M. Oliveira, Sérgio L. Cechin, Taisy S. Weber
Experiments on the analysis of phase/frequency-modulated RF signals using digital tester channelsFull-text access may be available. Sign in or learn about subscription options.pp. 1-7
by N. Pous, F. Azaïs, L. Latorre, P. Nouet, J. Rivoir
Evaluation of a new low cost software level fault tolerance technique to cope with soft errorsFull-text access may be available. Sign in or learn about subscription options.pp. 1-3
by J. F. Tarrillo, C. A. Lisboa, L. Carro, C. Argyrides, D. K. Pradhan
An evaluation of free/open source static analysis tools applied to embedded softwareFull-text access may be available. Sign in or learn about subscription options.pp. 1-6
by Lucas Torri, Guilherme Fachini, Leonardo Steinfeld, Vesmar Camara, Luigi Carro, Érika Cota
Dependability validation of a cryptoprocessor to SEU effectsFull-text access may be available. Sign in or learn about subscription options.pp. 1-6
by Vladimir Trujillo-Olaya, John M. Espinosa-Duran, Jaime Velasco-Medina, Raoul Velazco
Reliability analysis of small delay defects in vias located in signal pathsFull-text access may be available. Sign in or learn about subscription options.pp. 1-6
by Hector Villacorta, Victor Champac, Chuck Hawkins, Jaume Segura
Reliability of on-board computer for ITASAT university satelliteFull-text access may be available. Sign in or learn about subscription options.pp. 1-3
by Edson Vinci, Osamu Saotome
IEEE computer societyFreely available from IEEE.pp. 1-1
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