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2022 IEEE/ACM 9th International Conference on Mobile Software Engineering and Systems (MobileSoft)

May 17 2022 to May 18 2022

Pittsburgh, PA, USA

ISBN: 978-1-4503-9301-0

Table of Contents

Title Page iiiFreely available from IEEE.pp. 1-1
Table of ContentsFreely available from IEEE.pp. v-vii
Message from the Chairs of MOBILESoft 2022Freely available from IEEE.pp. viii-viii
Organizing Committee of MOBILESoft 2022Freely available from IEEE.pp. ix-x
Program Committee of MOBILESoft 2022Freely available from IEEE.pp. xi-xix
Extending EcoAndroid with Automated Detection of Resource LeaksFull-text access may be available. Sign in or learn about subscription options.pp. 17-27
Towards Better mHealth Apps: Understanding Current Challenges and User ExpectationsFull-text access may be available. Sign in or learn about subscription options.pp. 33-37
ReChan: An Automated Analysis of Android App Release Notes to Report InconsistenciesFull-text access may be available. Sign in or learn about subscription options.pp. 73-83
Complement of Dynamic Slicing for Android Applications with Def-Use Analysis for Application ResourcesFull-text access may be available. Sign in or learn about subscription options.pp. 100-101
Evaluating Swift-to-Kotlin and Kotlin-to-Swift TranspilersFull-text access may be available. Sign in or learn about subscription options.pp. 102-106
SwiftDependencyChecker: Detecting Vulnerable Dependencies Declared Through CocoaPods, Carthage and Swift PMFull-text access may be available. Sign in or learn about subscription options.pp. 107-111
Mobile GUI test script generation from natural language descriptions using pre-trained modelFull-text access may be available. Sign in or learn about subscription options.pp. 112-113
An empirical study of privacy labels on the Apple iOS mobile app storeFull-text access may be available. Sign in or learn about subscription options.pp. 114-124
Adoption of Third-party Libraries in Mobile Apps: A Case Study on Open-source Android ApplicationsFull-text access may be available. Sign in or learn about subscription options.pp. 125-135
Author IndexFreely available from IEEE.pp. 137-137
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