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2021 IEEE/ACM Sixth International Parallel Data Systems Workshop (PDSW)

Nov. 15 2021 to Nov. 15 2021

St. Louis, MO, USA

ISBN: 978-1-6654-1837-9

Table of Contents

[Title page]Freely available from IEEE.pp. 1-1
[Copyright notice]Freely available from IEEE.pp. 2-2
Table of ContentsFreely available from IEEE.pp. 3-4
Message from the Workshop ChairsFreely available from IEEE.pp. 5-5
Workshop OrganizationFreely available from IEEE.pp. 6-7
New Challenges of Benchmarking All-Flash Storage for HPCFull-text access may be available. Sign in or learn about subscription options.pp. 1-8
by Glenn K. Lockwood, Alberto Chiusole, Nicholas J. Wright
Understanding the I/O Impact on the Performance of High-Throughput Molecular DockingFull-text access may be available. Sign in or learn about subscription options.pp. 9-14
by Stefano Markidis, Davide Gadioli, Emanuele Vitali, Gianluca Palermo
I/O Bottleneck Detection and Tuning: Connecting the Dots using Interactive Log AnalysisFull-text access may be available. Sign in or learn about subscription options.pp. 15-22
by Jean Luca Bez, Houjun Tang, Bing Xie, David Williams-Young, Rob Latham, Rob Ross, Sarp Oral, Suren Byna
Data-Aware Storage Tiering for Deep LearningFull-text access may be available. Sign in or learn about subscription options.pp. 23-28
by Cong Xu, Suparna Bhattacharya, Martin Foltin, Suren Byna, Paolo Faraboschi
SCTuner: An Autotuner Addressing Dynamic I/O Needs on Supercomputer I/O SubsystemsFull-text access may be available. Sign in or learn about subscription options.pp. 29-34
by Houjun Tang, Bing Xie, Suren Byna, Philip Carns, Quincey Koziol, Sudarsun Kannan, Jay Lofstead, Sarp Oral
User-Centric System Fault Identification Using IO500 BenchmarkFull-text access may be available. Sign in or learn about subscription options.pp. 35-40
by Radita Liem, Dmytro Povaliaiev, Jay Lofstead, Julian Kunkel, Christian Terboven
Verifying IO Synchronization from MPI TracesFull-text access may be available. Sign in or learn about subscription options.pp. 41-46
by Sushma Yellapragada, Chen Wang, Marc Snir
Author IndexFreely available from IEEE.pp. 47-47
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