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2016 IEEE/ACM 1st International Workshop on Emotional Awareness in Software Engineering (SEmotion)

May 17 2016 to May 17 2016

Austin, TX, USA

Table of Contents

[Title page i]Freely available from IEEE.pp. i-i
[Title page iii]Freely available from IEEE.pp. iii-iii
[Copyright notice]Freely available from IEEE.pp. iv-iv
Table of contentsFreely available from IEEE.pp. v-vi
Message from the Workshop ChairsFreely available from IEEE.pp. vii-vii
Committees and ReviewersFreely available from IEEE.pp. viii-viii
Sponsors and SupportersFreely available from IEEE.pp. ix-xi
Invited Talk: Fun with Software Developers and BiometricsFull-text access may be available. Sign in or learn about subscription options.pp. 1-2
by Andrew Begel
Affective Trust as a Predictor of Successful Collaboration in Distributed Software ProjectsFull-text access may be available. Sign in or learn about subscription options.pp. 3-5
by Fabio Calefato, Filippo Lanubile
Outcomes of Emotional Content from Agile Team Forum PostsFull-text access may be available. Sign in or learn about subscription options.pp. 6-11
by Allen Marshall, Rose F. Gamble, Matthew L. Hale
Understanding Question Quality through Affective Aspect in Q&A SiteFull-text access may be available. Sign in or learn about subscription options.pp. 12-17
by Jirayus Jiarpakdee, Akinori Ihara, Ken-Ichi Matsumoto
Cognitive-Affective Modelling Approach in Tutoring SystemFull-text access may be available. Sign in or learn about subscription options.pp. 18-21
by N. Sofia Huerta-Pacheco, Genaro Rebolledo-Mendez, Sergio Hernandez-Gonzalez
Psychophysiological Observing and Analysis Tool for User ExperienceFull-text access may be available. Sign in or learn about subscription options.pp. 22-25
by Ahmed Husseini Orabi, Mahmoud Husseini Orabi, Timothy Lethbridge
Invited Talk: Towards an Emotionally Aware Development EnvironmentFull-text access may be available. Sign in or learn about subscription options.pp. 26-27
by Jenna Wise, Brent Prox, Benjamin Clark, Bonita Sharif
Invited Session: Hands-On Sensors 101Full-text access may be available. Sign in or learn about subscription options.pp. 28-29
by Chris Parnin, Andrew Begel
Author indexFreely available from IEEE.pp. 30-30
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