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2015 IEEE/ACM 1st International Workshop on Software Engineering for Smart Cyber-Physical Systems (SEsCPS)

May 17 2015 to May 17 2015

Florence, Italy

Table of Contents

[Title page i]Freely available from IEEE.pp. i-i
[Title page iii]Freely available from IEEE.pp. iii-iii
[Copyright notice]Freely available from IEEE.pp. iv-iv
Table of contentsFreely available from IEEE.pp. v-vi
Message from the ChairsFreely available from IEEE.pp. vii-vii
Committees and reviewersFreely available from IEEE.pp. viii-ix
Modeling Challenges for CPS SystemsFull-text access may be available. Sign in or learn about subscription options.pp. 1-1
Accelerating Regression Testing for Scaled Self-Driving Cars with Lightweight Virtualization -- A Case StudyFull-text access may be available. Sign in or learn about subscription options.pp. 2-7
Fault Localization in Embedded Control System SoftwareFull-text access may be available. Sign in or learn about subscription options.pp. 8-14
Verification and Validation in Cyber Physical Systems: Research Challenges and a Way ForwardFull-text access may be available. Sign in or learn about subscription options.pp. 15-18
Continuous Collaboration: A Case Study on the Development of an Adaptive Cyber-physical SystemFull-text access may be available. Sign in or learn about subscription options.pp. 19-25
A Model-Based Approach for the Specification of a Virtual Power Plant Operating in Open ContextFull-text access may be available. Sign in or learn about subscription options.pp. 26-32
An Application Conflict Detection and Resolution System for Smart HomesFull-text access may be available. Sign in or learn about subscription options.pp. 33-39
Taming Heterogeneity and Distribution in sCPSFull-text access may be available. Sign in or learn about subscription options.pp. 40-43
Versioning in Cyber-physical Production System Engineering -- Best-Practice and Research AgendaFull-text access may be available. Sign in or learn about subscription options.pp. 44-47
Author indexFreely available from IEEE.pp. 56-56
[Publisher's information]Freely available from IEEE.pp. 58-58
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