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2023 IEEE 9th International Conference on Space Mission Challenges for Information Technology (SMC-IT)

July 18 2023 to July 27 2023

Pasadena, CA, USA

ISBN: 979-8-3503-4137-9

Table of Contents

Title Page iFreely available from IEEE.pp. 1-1
Title Page iiiFreely available from IEEE.pp. 3-3
Copyright PageFreely available from IEEE.pp. 4-4
Table of ContentsFreely available from IEEE.pp. 5-7
PrefaceFreely available from IEEE.pp. 8-10
Conference OrganizationFreely available from IEEE.pp. 11-11
ReviewersFreely available from IEEE.pp. 12-12
Sub-ReviewersFreely available from IEEE.pp. 13-13
Availability Vs. Lifetime Trade-Space In Spacecraft ComputersFull-text access may be available. Sign in or learn about subscription options.pp. 7-14
Early Design Exploration of Space System Scenarios Using Assume-Guarantee ContractsFull-text access may be available. Sign in or learn about subscription options.pp. 15-24
Web-based 3D Visualization for Flight Mission Network Cybersecurity AnalysisFull-text access may be available. Sign in or learn about subscription options.pp. 35-44
How to Scrub a Launch: Spaceport CybersecurityFull-text access may be available. Sign in or learn about subscription options.pp. 56-67
A Research Agenda for Space Flight Software SecurityFull-text access may be available. Sign in or learn about subscription options.pp. 68-77
WannaFly: An Approach to Satellite RansomwareFull-text access may be available. Sign in or learn about subscription options.pp. 84-93
MUSTANG: A Workhorse for NASA Spaceflight AvionicsFull-text access may be available. Sign in or learn about subscription options.pp. 94-103
The DART Autonomy SystemFull-text access may be available. Sign in or learn about subscription options.pp. 104-113
A Hybrid Space Architecture for Robust and Resilient Satellite ServicesFull-text access may be available. Sign in or learn about subscription options.pp. 114-122
Coverage-guided State Space Exploration of Autonomous Cyber-Physical SystemsFull-text access may be available. Sign in or learn about subscription options.pp. 126-127
Author IndexFreely available from IEEE.pp. 129-129
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