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Proceedings
SPRO
SPRO 2015
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2015 IEEE/ACM 1st International Workshop on Software Protection (SPRO)
May 19 2015 to May 19 2015
Florence, Italy
Table of Contents
Title Page i
Freely available from IEEE.
pp. i-i
Title Page iii
Freely available from IEEE.
pp. iii-iii
Copyright Page
Freely available from IEEE.
pp. iv-iv
Table of Contents
Freely available from IEEE.
pp. v-vi
Message from the Chairs
Freely available from IEEE.
pp. vii-viii
Committees and Reviewers
Freely available from IEEE.
pp. ix-x
Sponsors and Supporters
Freely available from IEEE.
pp. xi-xi
Software Security: Squaring the Circle?
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pp. 1-1
by
Bart Preneel
Making Advanced Software Protection Tools Usable for Non-experts
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pp. 2-2
by
Bjorn De Sutter
Obfuscator-LLVM -- Software Protection for the Masses
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pp. 3-9
by
Pascal Junod
,
Julien Rinaldini
,
Johan Wehrli
,
Julie Michielin
Matryoshka: Strengthening Software Protection via Nested Virtual Machines
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pp. 10-16
by
Sudeep Ghosh
,
Jason D. Hiser
,
Jack W. Davidson
Using Virtual Machine Protections to Enhance Whitebox Cryptography
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pp. 17-23
by
Joseph Gan
,
Roddy Kok
,
Pankaj Kohli
,
Yun Ding
,
Benjamin Mah
Obfuscating Windows DLLs
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pp. 24-30
by
Bert Abrath
,
Bart Coppens
,
Stijn Volckaert
,
Bjorn De Sutter
Code Artificiality: A Metric for the Code Stealth Based on an N-Gram Model
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pp. 31-37
by
Yuichiro Kanzaki
,
Akito Monden
,
Christian Collberg
Assessment of Data Obfuscation with Residue Number Coding
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pp. 38-44
by
Biniam Fisseha Demissie
,
Mariano Ceccato
,
Roberto Tiella
A Framework for Measuring Software Obfuscation Resilience against Automated Attacks
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pp. 45-51
by
Sebastian Banescu
,
Martin Ochoa
,
Alexander Pretschner
Automatic Discovery of Software Attacks via Backward Reasoning
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pp. 52-58
by
Cataldo Basile
,
Daniele Canavese
,
Jerome D'Annoville
,
Bjorn De Sutter
,
Fulvio Valenza
Infections as Abstract Symbolic Finite Automata: Formal Model and Applications
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pp. 59-65
by
Mila Dalla Preda
,
Isabella Mastroeni
Author Index
Freely available from IEEE.
pp. 66-66
[Publisher's information]
Freely available from IEEE.
pp. 68-68
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