1. Home
  2. Proceedings
  3. TEST
  4. TEST 1991
Default Cover Image

1991, Proceedings. International Test Conference

Oct. 26 1991 to Oct. 30 1991

Nashville, TN, USA

Table of Contents

Built-in-self-test considerations in a high-performance, general-purpose processorFull-text access may be available. Sign in or learn about subscription options.pp. 21
by S. Sarma
Production experience with built-in self-test in the IBM ES/9000 systemFull-text access may be available. Sign in or learn about subscription options.pp. 28
by P.H. Bardell, M.J. Lapointe
Built-in self-test of the VLSI content addressable filestoreFull-text access may be available. Sign in or learn about subscription options.pp. 37
by R. Illman, T. Bird, G. Catlow, S. Clarke, L. Theobald, G. Willetts
Built-in self-test for high-speed data-path circuitryFull-text access may be available. Sign in or learn about subscription options.pp. 47,48,49,50,51,52,53,54,55,56
by C.E. Stroud
A common approach to test generation and hardware verification based on temporal logicFull-text access may be available. Sign in or learn about subscription options.pp. 57,58,59,60,61,62,63,64,65,66
by T. Kropf, H. Wunderlich
Fast sequential ATPG based on implicit state enumerationFull-text access may be available. Sign in or learn about subscription options.pp. 67
by Hyunwoo Cho, G.D. Hachtel, F. Somenzi
A test generation method for sequential circuits based on maximum utilization of internal statesFull-text access may be available. Sign in or learn about subscription options.pp. 75,76,77,78,79,80,81,82
by T. Ono, M. Yoshida
A Sequential Test Generator with Explicit Elimination of Easy-To-Test FaultsFull-text access may be available. Sign in or learn about subscription options.pp. 83,84,85,86,87
by Tsu-Wei Ku, Wei-Kong Chia
Test generation: A boundary scan implementation for module interconnect testingFull-text access may be available. Sign in or learn about subscription options.pp. 88,89,90,91,92,93,94,95
by M.F. Lefebvre
IMPLEMENTING 1149.1 ON CMOS MICROPROCESSORSFull-text access may be available. Sign in or learn about subscription options.pp. 879
by W.C. Bruce, M.G. Gallup, G. Giles, T. Munns
Software testing - the state of the practiceFull-text access may be available. Sign in or learn about subscription options.pp. 1107-1107
by E.F. Miller
Quality in test education?Full-text access may be available. Sign in or learn about subscription options.pp. 1121
by K. Rose
CMOS bridging fault detectionFull-text access may be available. Sign in or learn about subscription options.pp. 1123
by T.M. Storey, W. Maly
Low overhead built-in testable error detection and correction with excellent fault coverageFull-text access may be available. Sign in or learn about subscription options.pp. 916
by M. Katoozi, A. Nordsieck
Showing 14 out of 14