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Proceedings. 21st VLSI Test Symposium, 2003.

May 1 2003 to May 1 2003

Napa, CA, USA

Table of Contents

Proceedings 21st IEEE VLSI Test SymposiumFreely available from IEEE.
Keynote AddressFull-text access may be available. Sign in or learn about subscription options.pp. 3-3
by J. Fields
A circuit level fault model for resistive opens and bridgesFull-text access may be available. Sign in or learn about subscription options.pp. 379-384
by Zhuo Li, Xiang Lu, Wangqi Qiu, Weiping Shi, D.M.H. Walker
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