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2010 28th VLSI Test Symposium (VTS)

April 19 2010 to April 22 2010

Santa Cruz, CA

Table of Contents

Test Technology Technical Council (TTTC)Freely available from IEEE.pp. xix-xxi
Density estimation for analog/RF test problem solvingFull-text access may be available. Sign in or learn about subscription options.pp. 41-41
by Salvador Mir, Haralampos-G. Stratigopoulos, Ahcène Bounceur
Design, analysis, and test of low-power and reliable flexible electronicsFull-text access may be available. Sign in or learn about subscription options.pp. 82-82
by Kwang-Ting Cheng, Tsung-Ching Huang
Innovative practices session 3C: Industrial practices of test cost reduction techniques: Impact and design tradeoffsFull-text access may be available. Sign in or learn about subscription options.pp. 123-123
by Sarveswara Tammali
Panel 4A: Apprentice - VTS edition: Season 3Freely available from IEEE.pp. 129-129
by Kee Sup Kim
Special session 4B: Panel low-power test and noise-aware test: Foes or friends?Freely available from IEEE.pp. 130-130
by Ilia Polian
Special session 4C: Thesis research poster sessionFreely available from IEEE.pp. 131-131
by Haralampos Stratigopoulos
Low-capture-power at-speed testing using partial launch-on-capture test schemeFull-text access may be available. Sign in or learn about subscription options.pp. 141-146
by Zhen Chen, Dong Xiang
Evaluating yield and testing impact of sub-wavelength lithographyFull-text access may be available. Sign in or learn about subscription options.pp. 200-205
by Wing Chiu Tam, R D Blanton, Wojciech P Maly
Special session 8B: New topic MOS/MTJ-hybrid circuit with nonvolatile logic-in-memory architecture and its impactFull-text access may be available. Sign in or learn about subscription options.pp. 258-258
by Takahiro Hanyu
Special session 8C: Panel EDA for analog DFT/ATPG – will SoC cost pressures make this a reality?Freely available from IEEE.pp. 259-259
by Arani Sinha
Innovative practices session 9C: Implications of power delivery network for validation and testingFull-text access may be available. Sign in or learn about subscription options.pp. 282-282
by Suriyaprakash Natarajan
Calibration-assisted production testing for digitally-calibrated ADCsFull-text access may be available. Sign in or learn about subscription options.pp. 295-300
by Hsiu-Ming Chang, Kuan-Yu Lin, Kwang-Ting Cheng
A novel hybrid delay testing scheme with low test power, volume, and timeFull-text access may be available. Sign in or learn about subscription options.pp. 307-312
by Zhen Chen, Sharad Seth, Dong Xiang
Special session 11B: Hot topic hardware security: Design, test and verification issuesFull-text access may be available. Sign in or learn about subscription options.pp. 349-349
by Swarup Bhunia, Anand Raghunathan
Special session 12A: Panel adaptive analog test: Feasibility and opportunities aheadFreely available from IEEE.pp. 353-353
by Haralampos-G. Stratigopoulos
Panel 12C: Apprentice – VTS edition judging sessionFreely available from IEEE.pp. 355-355
by Kee Sup Kim
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