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29th VLSI Test Symposium

May 1 2011 to May 5 2011

Dana Point, CA

Table of Contents

Special session 4A: New topics parametric yield and reliability of 3D integrated circuits: New challenges and solutionsFull-text access may be available. Sign in or learn about subscription options.pp. 99-99
by Siddharth Garg, Diana Marculescu
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