Default Cover Image

Proceedings of the Sixth Annual IEEE International Workshop on Workload Characterization. WWC-6

Oct. 27 2003 to Oct. 27 2003

Austin, TX, USA

Table of Contents

2003 IEEE International Workshop on Workload Characterization (IEEE Cat. No.03EX775)Full-text access may be available. Sign in or learn about subscription options.
A characterization of visual feature recognitionFull-text access may be available. Sign in or learn about subscription options.pp. 3,4,5,6,7,8,9,10,11
Towards workload characterization of auction sitesFull-text access may be available. Sign in or learn about subscription options.pp. 12,13,14,15,16,17,18,19,20
Improving the performance of OLTP workloads on SMP computer systems by limiting modified cache linesFull-text access may be available. Sign in or learn about subscription options.pp. 21,22,23,24,25,26,27,28,29
Performance characterization of TCP/IP packet processing in commercial server workloadsFull-text access may be available. Sign in or learn about subscription options.pp. 33,34,35,36,37,38,39,40,41
PacketBench: a tool for workload characterization of network processingFull-text access may be available. Sign in or learn about subscription options.pp. 42,43,44,45,46,47,48,49,50
Evaluating and modeling window synchronization in highly multiplexed flowsFull-text access may be available. Sign in or learn about subscription options.pp. 51,52,53,54,55,56,57,58,59,60,61
An analysis of disk performance in VMware ESX server virtual machinesFull-text access may be available. Sign in or learn about subscription options.pp. 65,66,67,68,69,70,71,72,73,74,75,76
Intrinsic data locality of modern scientific workloadsFull-text access may be available. Sign in or learn about subscription options.pp. 77,78,79,80,81,82,83,84,85
Exploiting streams in instruction and data address trace compressionFull-text access may be available. Sign in or learn about subscription options.pp. 99,100,101,102,103,104,105,106,107
Identifying program power phase behavior using power vectorsFull-text access may be available. Sign in or learn about subscription options.pp. 108,109,110,111,112,113,114,115,116,117,118
Characterization of embedded applications for decoupled processor architectureFull-text access may be available. Sign in or learn about subscription options.pp. 119,120,121,122,123,124,125,126,127
Author indexFreely available from IEEE.pp. 129-130
Showing 14 out of 14