2022 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)
Model-Based Analysis of Single-Event Upset (SEU) Vulnerability of 6T SRAM Using FinFET Technologies
DOI Bookmark: 10.1109/DFT56152.2022.9962348
Authors
Semiu A. Olowogemo, Vanderbilt University,Department of Electrical and Computer Engineering,Nashville,TNHao Qiu, Vanderbilt University,Department of Electrical and Computer Engineering,Nashville,TN
Bor-Tyng Lin, Vanderbilt University,Department of Electrical and Computer Engineering,Nashville,TN
William H. Robinson, Georgia Institute of Technology,School of Electrical and Computer Engineering,Atlanta,GA
Daniel B. Limbrick, North Carolina A&T State University,Department of Electrical and Computer Engineering,Greensboro,NC