Achieving high transition delay fault coverage with partial DTSFF scan chains

Gefu Xu; Adit D. Singh

doi:10.1109/TEST.2007.4437608

International Test Conference 2007

Achieving high transition delay fault coverage with partial DTSFF scan chains

Year: 2007

DOI Bookmark: 10.1109/TEST.2007.4437608

Authors

Gefu Xu, Auburn University, AL, USA
Adit D. Singh, Auburn University, AL, USA

Abstract

The delay test scan flip-flop (DTSFF) has been recently presented as a low cost DFT technique to achieve both launch-on-shift (LOS) and launch-on-capture (LOC) scan delay tests, without the need for a fast scan enable signal. Such a combined delay test strategy can achieve near perfect transition delay fault (TDF) coverage which eludes commonly supported LOC only delay tests. In this paper we show that a partial DTSFF scheme, which replaces only 20-40% carefully chosen scan flip-flops in the scan chain with the new DTSFF can achieve most of the coverage benefits of a full DTSFF design while minimizing area overhead.

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Achieving high transition delay fault coverage with partial DTSFF scan chains

Authors

Abstract

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